Managing (High) Tension: Atomic Resolution (S)TEM from 30 kV to 300 kV

Speaker: Thomas C. Isabell, JEOL USA, Inc.
Date & Time: Tuesday, October 10, 2017 at 3:00 PM
Location: AMPEL 311
Local Contact: Alan Maigne
Intended Audience:

Choosing the correct microscope high tension, or accelerating voltage, is an important experimental consideration for TEM imaging and microanalysis.    Higher accelerating voltages naturally lead to better spatial resolution for imaging, but will also lead to accelerated specimen damage.   For microanalysis, lower accelerating voltages mean more beam spreading and worse spatial resolution, but also enhanced microanalysis cross sections for EDS and EELS.   A new generation of aberration corrected microscopes gives the user the flexibility to operate over a wide range of high tension with unprecedented imaging and chemical spatial resolution.  This means that on the same instrument, the voltage can be dialed in for a given experiment and readily changed as different experimental needs arise.  The addition of a cold field emission gun, advanced aberration correctors and advanced detectors only enhances operation at both high and low voltages, further adding to instrument flexibility.

 

Thomas C. Isabell, Ph.D.

Tom is Director of Product Management at JEOL USA, leading the TEM, SEM and Microprobe product divisions.  Since joining JEOL in 2003 as Assistant Product Manager, Tom has worked closely with the JEOL USA product groups, JEOL Ltd. in Japan and with JEOL customers to help keep the company at the forefront of technology in materials and life sciences research.  Prior to joining JEOL, Tom held positions in business development at EmiSpec in Tempe, Arizona and applications support at Fischione Instruments in Export, Pennsylvania.  Tom received a B.S. in Materials Science and Engineering from the University of Minnesota and a Ph.D. in Materials Science and Engineering from Northwestern University.